Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
Crossref DOI link: https://doi.org/10.1134/S1027451019050380
Published Online: 2019-10-21
Published Print: 2019-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sybina, Yu. S.
Borgardt, N. I.
Lazarenko, P. I.
Parsegova, V. S.
Prikhodko, A. S.
Sherchenkov, A. A.
Text and Data Mining valid from 2019-09-01
Version of Record valid from 2019-09-01
Article History
Received: 29 November 2018
Revised: 16 January 2019
Accepted: 11 February 2019
First Online: 21 October 2019