On the Atomic-Force Microscopy and Electrical Properties of Single-Crystal Bismuth Films
Crossref DOI link: https://doi.org/10.1134/S1027451020050055
Published Online: 2020-10-19
Published Print: 2020-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Grabov, V. M.
Gerega, V. A.
Demidov, E. V.
Komarov, V. A.
Starytsin, M. V.
Suslov, A. V.
Suslov, M. V.
Text and Data Mining valid from 2020-09-01
Version of Record valid from 2020-09-01
Article History
Received: 21 December 2019
Revised: 25 January 2020
Accepted: 27 January 2020
First Online: 19 October 2020