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Structure of МеSi Silicide Films (Me: Li, Rb, K and Cs) According to Electron Microscopy Data and the Diffraction of Slow Electrons

Published Online: 2020-10-19

Published Print: 2020-09

Authors

Normuradov, M. T.

Risbaev, A. S.

Khujaniyozov, J. B.

Normuradov, D. A.
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Text and Data Mining valid from 2020-09-01

Version of Record valid from 2020-09-01
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Article History

Received: 14 January 2020

Revised: 25 February 2020

Accepted: 28 February 2020

First Online: 19 October 2020

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