X-ray Reflecto-Interferometry Technique Using a Microfocus Laboratory Source
Crossref DOI link: https://doi.org/10.1134/S1027451021010158
Published Online: 2021-04-20
Published Print: 2021-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Voevodina, M. A.
Lyatun, S. S.
Barannikov, A. A.
Lyatun, I. I.
Snigireva, I. I.
Snigirev, A. A.
Text and Data Mining valid from 2021-01-01
Version of Record valid from 2021-01-01
Article History
Received: 6 March 2020
Revised: 25 April 2020
Accepted: 30 April 2020
First Online: 20 April 2021