Electronic Structure and Properties of Nanoscale Structures Created on the Surface of a Free Si/Cu Film System
Crossref DOI link: https://doi.org/10.1134/S1027451021020221
Published Online: 2021-04-21
Published Print: 2021-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Isakhanov, Z. A.
Yorkulov, R. M.
Umirzakov, B. E.
Isayev, M. Sh.
Abduvayitov, A. A.
Text and Data Mining valid from 2021-03-01
Version of Record valid from 2021-03-01
Article History
Received: 6 July 2020
Revised: 18 September 2020
Accepted: 22 September 2020
First Online: 21 April 2021