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X-Ray Reflectometry for Comparison of Structural Organization of Fullerenes C60/C70 in Polystyrene Thin Films

Published Online: 2021-08-30

Published Print: 2021-07

Authors

Tropin, T. V.

Karpets, M. L.

Kosiachkin, Ye.

Aksenov, V. L.
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Text and Data Mining valid from 2021-07-01

Version of Record valid from 2021-07-01
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Article History

Received: 23 November 2020

Revised: 24 January 2021

Accepted: 27 January 2021

First Online: 30 August 2021

Document is current