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Modeling of the Degradation of Resonant-Tunneling Diodes Using Artificial Neural Networks

Published Online: 2022-03-01

Published Print: 2022-02

Authors

Pchelintsev, K. P.

Vetrova, N. A.

Shashurin, V. D.
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Text and Data Mining valid from 2022-02-01

Version of Record valid from 2022-02-01
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Article History

Received: 31 May 2021

Revised: 20 June 2021

Accepted: 30 June 2021

First Online: 1 March 2022

CONFLICT OF INTEREST

: The authors declare that they have no conflicts of interest.

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