Modern Scanning Electron Microscopy. 1. Secondary Electron Emission
Crossref DOI link: https://doi.org/10.1134/S1027451023030138
Published Online: 2023-06-16
Published Print: 2023-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Novikov, Yu. A.
Text and Data Mining valid from 2023-06-01
Version of Record valid from 2023-06-01
Article History
Received: 22 September 2022
Revised: 17 November 2022
Accepted: 17 November 2022
First Online: 16 June 2023
CONFLICT OF INTEREST
: The authors declare that they have no conflicts of interest.