Migration of Chromium on the Silicon Oxide Surface under a Strong Electric Field
Crossref DOI link: https://doi.org/10.1134/S1027451024701179
Published Online: 2025-03-01
Published Print: 2024-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Uvarov, I. V.
Mazaletskiy, L. A.
Text and Data Mining valid from 2024-12-01
Version of Record valid from 2024-12-01
Article History
Received: 12 April 2024
Revised: 16 June 2024
Accepted: 16 June 2024
First Online: 1 March 2025
CONFLICT OF INTEREST
: The authors of this work declare that they have no conflicts of interest.