The Influence of Charged Conductive Atomic-Force Microscope Tip on Regimes of Electronic Transport in Diffusive Doped InAs Nanowire
Crossref DOI link: https://doi.org/10.1134/S102745102470188X
Published Online: 2025-03-17
Published Print: 2024-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhukov, A. A.
Text and Data Mining valid from 2024-12-01
Version of Record valid from 2024-12-01
Article History
Received: 7 July 2024
Revised: 21 August 2024
Accepted: 21 August 2024
First Online: 17 March 2025
CONFLICT OF INTEREST
: As author of this work, I declare that I have no conflicts of interest.