Origin of Degradation of the CaF2/BaF2 Buffer Layers on Si(111)
Crossref DOI link: https://doi.org/10.1134/S1028335820010103
Published Online: 2020-05-07
Published Print: 2020-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Neizvestny, I. G.
Ishchenko, D. V.
Akhundov, I. O.
Suprun, S. P.
Tereshchenko, O. E.
Text and Data Mining valid from 2020-01-01
Version of Record valid from 2020-01-01
Article History
Received: 25 October 2019
Revised: 25 October 2019
Accepted: 8 November 2019
First Online: 7 May 2020