Interface Instability of Integrated Circuit Layers under Electric Current and Mechanical Stress
Crossref DOI link: https://doi.org/10.1134/S102995992203002X
Published Online: 2022-06-17
Published Print: 2022-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Makhviladze, T. M.
Sarychev, M. E.
Text and Data Mining valid from 2022-06-01
Version of Record valid from 2022-06-01
Article History
Received: 23 June 2021
Revised: 10 December 2021
Accepted: 14 December 2021
First Online: 17 June 2022