An instrument for simultaneous visual and thermal testing of microelectronic devices
Crossref DOI link: https://doi.org/10.1134/S1061830916020042
Published Online: 2016-05-12
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Machikhin, A. S.
Batshev, V. I.
Text and Data Mining valid from 2016-02-01
Version of Record valid from 2016-02-01
Article History
Received: 28 April 2015
First Online: 12 May 2016