Digital X-ray 3D-microtomograph for testing materials and components used in electronics
Crossref DOI link: https://doi.org/10.1134/S1061830916090060
Published Online: 2016-11-24
Published Print: 2016-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Syryamkin, V. I.
Text and Data Mining valid from 2016-09-01
Version of Record valid from 2016-09-01
Article History
Received: 21 June 2014
First Online: 24 November 2016