Evaluating parameters of semiconductors from their microwave reflection spectra in a wide temperature range
Crossref DOI link: https://doi.org/10.1134/S1061830917020073
Published Online: 2017-05-04
Published Print: 2017-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Usanov, D. A.
Postel’ga, A. E.
Gurov, K. A.
License valid from 2017-02-01