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Testing Semiconductor Products Using Low-Frequency Noise Parameters

Crossref DOI link: https://doi.org/10.1134/S1061830922010028

Published Online: 2022-04-26

Published Print: 2022-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Gorlov, M. I.

Sergeev, V. A.
License Information

Text and Data Mining valid from 2022-01-01

Version of Record valid from 2022-01-01
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Article History

Received: 7 December 2021

Revised: 17 December 2021

Accepted: 17 December 2021

First Online: 26 April 2022