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Testing Semiconductor Products Using Low-Frequency Noise Parameters

Published Online: 2024-09-23

Published Print: 2024-06

Authors

Gorlov, M. I.

Sergeev, V. A.
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Text and Data Mining valid from 2024-06-01

Version of Record valid from 2024-06-01
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Article History

Received: 1 December 2023

Revised: 28 May 2024

Accepted: 31 May 2024

First Online: 23 September 2024

CONFLICT OF INTEREST

: The authors of this work declare that they have no conflicts of interest.

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