A Thin Layer Method for the LA-ICP-MS Analysis of Trace Element Concentrates
Crossref DOI link: https://doi.org/10.1134/S1061934823030097
Published Online: 2023-05-06
Published Print: 2023-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Medvedev, N. S.
Kurbatova, V. D.
Saprykin, A. I.
Text and Data Mining valid from 2023-03-01
Version of Record valid from 2023-03-01
Article History
Received: 11 April 2022
Revised: 18 June 2022
Accepted: 20 June 2022
First Online: 6 May 2023
CONFLICT OF INTEREST
: The authors declare that they have no conflicts of interest.