Document is current

Any future updates will be listed below

Modeling of the secondary breakdown in a lateral DMOS transistor by irradiation

Crossref DOI link: https://doi.org/10.1134/S1063739714070117

Published Online: 2014-11-14

Published Print: 2014-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark