Determination of the indium arsenide autoepitaxial layers’ thickness by Fourier-Transform Infrared Spectroscopy
Crossref DOI link: https://doi.org/10.1134/S1063739715080156
Published Online: 2015-11-21
Published Print: 2015-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Komkov, O. S.
Firsov, D. D.
Kovalishina, E. A.
Petrov, A. S.
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