Electrical properties of a TiN/Ti x Al1 – x O y /TiN memristor device manufactured by magnetron sputtering
Crossref DOI link: https://doi.org/10.1134/S1063739716060020
Published Online: 2017-02-09
Published Print: 2016-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bobylev, A. N.
Udovichenko, S. Yu.
Text and Data Mining valid from 2016-11-01
Version of Record valid from 2016-11-01
Article History
Received: 17 November 2015
First Online: 9 February 2017