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Application of Two-Wavelength X-Ray Optical Scheme for Combined Measurements of X-Ray Specular Reflection and Diffuse Scattering to Study Multilayered Thin Film Structures

Crossref DOI link: https://doi.org/10.1134/S1063739717070101

Published Online: 2018-03-05

Published Print: 2017-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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