Document is current

Any future updates will be listed below

The Instability of the CV Characteristics’ Capacitance When Measuring AlGaN/GaN-Heterostructures and the HEMT-Transistors Based on Them

Crossref DOI link: https://doi.org/10.1134/S1063739717080066

Published Online: 2018-03-07

Published Print: 2017-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark