The Influence of the Dopant Concentration in a Silicon Film on the Magnetic Sensitivity of SOI Field-Effect Hall Sensors
Crossref DOI link: https://doi.org/10.1134/S1063739718070065
Published Online: 2019-03-13
Published Print: 2018-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Korolev, M. A.
Kozlov, A. V.
Krasukov, A. Y.
Devlikanova, S. S.
Text and Data Mining valid from 2018-11-01
Article History
Received: 10 April 2017
Accepted: 13 June 2017
First Online: 13 March 2019