TCAD Simulation of Dose Radiation Effects in Sub-100-nm High-κ MOS Transistor Structures
Crossref DOI link: https://doi.org/10.1134/S1063739718070089
Published Online: 2019-03-13
Published Print: 2018-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Petrosyants, K. O.
Popov, D. A.
Bykov, D. V.
Text and Data Mining valid from 2018-11-01
Article History
Received: 13 June 2017
Accepted: 12 September 2017
First Online: 13 March 2019