Low Dose Rate Effects in Silicon-Based Devices and Integrated Circuits: A Review
Crossref DOI link: https://doi.org/10.1134/S1063739718080127
Published Online: 2019-03-20
Published Print: 2018-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tapero, K. I.
Text and Data Mining valid from 2018-12-01
Article History
Received: 2 November 2015
First Online: 20 March 2019