Effect of the Built-in Surface Potential on the I–V Characteristics of Silicon MIS Structures
Crossref DOI link: https://doi.org/10.1134/S1063739719010098
Published Online: 2019-05-14
Published Print: 2019-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yafarov, R. K.
Text and Data Mining valid from 2019-03-01
Version of Record valid from 2019-03-01
Article History
Received: 26 January 2018
First Online: 14 May 2019