Formation of Dielectric Nanolayers of Aluminum and Silicon Oxides on AIIIBV Semiconductors
Crossref DOI link: https://doi.org/10.1134/S1063739719020033
Published Online: 2019-05-14
Published Print: 2019-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ezhovskii, Yu. K.
Text and Data Mining valid from 2019-03-01
Version of Record valid from 2019-03-01
Article History
Received: 14 June 2018
First Online: 14 May 2019