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Investigating the Electrothermal Characteristics of Partially Depleted Submicron SOI CMOS Transistors in an Extended Temperature Range

Crossref DOI link: https://doi.org/10.1134/S1063739720010102

Published Online: 2020-03-10

Published Print: 2020-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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