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Fault Tolerant Reversible T Latch with Enhanced Testability at Nano-Scale for Application of Ripple Counters

Crossref DOI link: https://doi.org/10.1134/S1063739721060093

Published Online: 2021-12-16

Published Print: 2021-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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