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Limitations of Methods for Evaluating the Hardness of Microelectronic Devices to Single Event Effects on Ion Accelerators

Published Online: 2022-03-17

Published Print: 2022-02

Authors

Chumakov, A. I.

Sogoyan, A. V.

Yanenko, A. V.
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Text and Data Mining valid from 2022-02-01

Version of Record valid from 2022-02-01
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Article History

Received: 23 February 2021

Revised: 15 May 2021

Accepted: 30 May 2021

First Online: 17 March 2022

CONFLICT OF INTEREST

: The authors declare that they have no conflict of interest.

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