Parameters of Gaseous Phase and Kinetics of Reactive Ion Etching of SiO2 in CF4/C4F8/Ar/He Plasma
Crossref DOI link: https://doi.org/10.1134/S1063739722700093
Published Online: 2022-12-23
Published Print: 2022-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Efremov, A. M.
Kwon, K.-H.
Text and Data Mining valid from 2022-12-01
Version of Record valid from 2022-12-01
Article History
Received: 1 February 2022
Revised: 12 May 2022
Accepted: 12 May 2022
First Online: 23 December 2022