Simulation of Silicon FETs with a Fully Enclosed Gate with a High-k Gate Dielectric
Crossref DOI link: https://doi.org/10.1134/S1063739723700361
Published Online: 2023-10-01
Published Print: 2023-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Masalskii, N. V.
Text and Data Mining valid from 2023-08-01
Version of Record valid from 2023-08-01
Article History
Received: 6 February 2023
Revised: 1 March 2023
Accepted: 2 March 2023
First Online: 1 October 2023
CONFLICT OF INTEREST
: The author declares that he has no conflicts of interest.