Concentration of Fluorine Atoms and Kinetics of Reactive-Ion Etching of Silicon in CF4 + O2, CHF3 + O2, and C4F8 + O2 Mixtures
Crossref DOI link: https://doi.org/10.1134/S1063739723700488
Published Online: 2023-10-01
Published Print: 2023-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Efremov, A. M.
Bobylev, A. V.
Kwon, K.-H.
Text and Data Mining valid from 2023-08-01
Version of Record valid from 2023-08-01
Article History
Received: 5 April 2023
Revised: 20 April 2023
Accepted: 22 April 2023
First Online: 1 October 2023
CONFLICT OF INTEREST
: The authors declare that they have no conflicts of interest.