Influence of Hot Carrier Degradation on the Characteristics of a High-Voltage SOI Transistor with a Large Drift Region
Crossref DOI link: https://doi.org/10.1134/S1063739723700580
Published Online: 2023-11-01
Published Print: 2023-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Novoselov, A. S.
Masalskii, N. V.
Text and Data Mining valid from 2023-10-01
Version of Record valid from 2023-10-01
Article History
Received: 10 May 2023
Revised: 10 July 2023
Accepted: 10 July 2023
First Online: 1 November 2023
CONFLICT OF INTEREST
: The authors declare that they have no conflicts of interest.