Simulation of Silicon Field-Effect Conical GAA Nanotransistors with a Stacked SiO2/HfO2 Subgate Dielectric
Crossref DOI link: https://doi.org/10.1134/S1063739724600274
Published Online: 2024-07-26
Published Print: 2024-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Masal’skii, N. V.
Text and Data Mining valid from 2024-06-01
Version of Record valid from 2024-06-01
Article History
Received: 15 February 2024
Revised: 20 March 2024
Accepted: 20 March 2024
First Online: 26 July 2024
CONFLICT OF INTEREST
: The author of this work declares that he has no conflicts of interest.