Crossmark

Effect of Boundary Roughness on the Variability of the VAC of Silicon Field-Effect GAA Nanotransistors

Published Online: 2025-08-06

Published Print: 2025-04

Authors

Masalskii, N. V.
License Information

Text and Data Mining valid from 2025-04-01

Version of Record valid from 2025-04-01
More Information

Article History

Received: 23 January 2025

Revised: 20 March 2025

Accepted: 20 March 2025

First Online: 6 August 2025

CONFLICT OF INTEREST

: The author of this work declares that he has no conflicts of interest.

Document is current