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Features of Upsets Formation in VLSI under Pulsed Ionizing Radiation

Published Online: 2025-08-31

Published Print: 2025-06

Authors

Chumakov, A. I.
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Text and Data Mining valid from 2025-06-01

Version of Record valid from 2025-06-01
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Article History

Received: 14 April 2025

Revised: 28 April 2025

Accepted: 28 April 2025

First Online: 31 August 2025

CONFLICT OF INTEREST

: The author of this work declares that he has no conflicts of interest.

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