Distribution of Al and in impurities along homogeneous Ge-Si crystals grown by the Czochralski method using Si feeding rod
Crossref DOI link: https://doi.org/10.1134/S1063774514020114
Published Online: 2014-05-24
Published Print: 2014-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kyazimova, V. K.
Alekperov, A. I.
Zakhrabekova, Z. M.
Azhdarov, G. Kh.
Text and Data Mining valid from 2014-05-01