X-ray reflectometry of the specific features of structural distortions of He+-implanted Si(001) surface layers
Crossref DOI link: https://doi.org/10.1134/S1063774514020138
Published Online: 2014-05-24
Published Print: 2014-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lomov, A. A.
Myakonkikh, A. V.
Rudenko, K. V.
Chesnokov, Yu. M.
Text and Data Mining valid from 2014-05-01