Extended Defects in O+-Implanted Si Layers and Their Luminescence
Crossref DOI link: https://doi.org/10.1134/S1063774521040210
Published Online: 2021-07-23
Published Print: 2021-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Vdovin, V. I.
Fedina, L. I.
Gutakovskii, A. K.
Kalyadin, A. E.
Shek, E. I.
Shtel’makh, K. F.
Sobolev, N. A.
Text and Data Mining valid from 2021-07-01
Version of Record valid from 2021-07-01
Article History
Received: 9 June 2020
Revised: 15 July 2020
Accepted: 17 July 2020
First Online: 23 July 2021