Study of Wide-Gap Semiconductors Using Electron-Beam Induced Current Method
Crossref DOI link: https://doi.org/10.1134/S1063774521040222
Published Online: 2021-07-23
Published Print: 2021-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yakimov, E. B.
Text and Data Mining valid from 2021-07-01
Version of Record valid from 2021-07-01
Article History
Received: 9 June 2020
Revised: 29 June 2020
Accepted: 6 July 2020
First Online: 23 July 2021