Study of Defect and Spectral Characteristics of Light Emitting Diodes with Multiple InGaN/GaN Quantum Wells on Patterned Sapphire Substrates
Crossref DOI link: https://doi.org/10.1134/S1063774524600571
Published Online: 2024-11-14
Published Print: 2024-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Y.
Xie, G. Q.
Jin, G.
Text and Data Mining valid from 2024-10-01
Version of Record valid from 2024-10-01
Article History
Received: 21 April 2024
Revised: 16 June 2024
Accepted: 16 June 2024
First Online: 14 November 2024
CONFLICT OF INTEREST
: The authors of this work declare that they have no conflicts of interest.