Investigation of the optimal annealing temperature for the enhanced thermoelectric properties of MOCVD-grown ZnO films
Crossref DOI link: https://doi.org/10.1134/S1063776117040045
Published Online: 2017-05-24
Published Print: 2017-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mahmood, K.
Ali, A.
Arshad, M. I.
Ajaz un Nabi, M.
Amin, N.
Faraz Murtaza, S.
Rabia, S.
Azhar Khan, M.
Text and Data Mining valid from 2017-04-01
Version of Record valid from 2017-04-01
Article History
Received: 8 August 2016
First Online: 24 May 2017