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Influence of Time-of-Flight Chromatic Aberration on the Dynamics of Propagation of Pulsed Electron Beam in Ultrafast Electron Microscopy: A New Strategy for Better Temporal Resolution

Crossref DOI link: https://doi.org/10.1134/S106377611902002X

Published Online: 2019-05-28

Published Print: 2019-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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