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Atomic and Electronic Structure of Defect Ni Complexes and Oxygen Vacancies in HfO2 and Their Influence on Charge Transport in Memristors

Published Online: 2025-12-18

Published Print: 2025-09

Authors

Perevalov, T. V.

Islamov, D. R.

Chernov, A. A.
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Text and Data Mining valid from 2025-09-01

Version of Record valid from 2025-09-01
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Article History

Received: 17 September 2025

Revised: 7 October 2025

Accepted: 8 October 2025

First Online: 18 December 2025

CONFLICT OF INTEREST

: The authors of this work declare that they have no conflict of interests.

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