Electrical properties of MOS diodes In/TiO2/p-CdTe
Crossref DOI link: https://doi.org/10.1134/S1063782614040071
Published Online: 2014-04-17
Published Print: 2014-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Brus, V. V.
Ilashchuk, M. I.
Orletsky, I. G.
Maryanchuk, P. D.
Ulyanytskiy, K. S.
Text and Data Mining valid from 2014-04-01