Temperature selectivity of the radiation effect on silicon MOS transistors
Crossref DOI link: https://doi.org/10.1134/S1063782614050091
Published Online: 2014-05-07
Published Print: 2014-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Koman, B. P.
Text and Data Mining valid from 2014-05-01
