Properties of TiO2 films on silicon substrate
Crossref DOI link: https://doi.org/10.1134/S1063782614060141
Published Online: 2014-06-12
Published Print: 2014-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kalygina, V. M.
Novikov, V. A.
Petrova, Yu. S.
Tolbanov, O. P.
Chernikov, E. V.
Tcupiy, S. Yu.
Yaskevich, T. M.
Text and Data Mining valid from 2014-06-01