Electrical properties of thin-film semiconductor heterojunctions n-TiO2/p-CuInS2
Crossref DOI link: https://doi.org/10.1134/S1063782614080077
Published Online: 2014-08-06
Published Print: 2014-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Brus, V. V.
Orletsky, I. G.
Ilashchuk, M. I.
Maryanchuk, P. D.
Text and Data Mining valid from 2014-08-01
Version of Record valid from 2014-08-01
Article History
Received: 10 October 2013
Accepted: 21 October 2013
First Online: 6 August 2014